Seminar by SPECS Surface Nano Analysis GmbH

Seminar by SPECS Surface Nano Analysis GmbH

SPECS X-ray photoelectron spectroscopy (XPS) instruments:
state-of-the-art technology, compact and individually designed systems for surface analysis
by Dr. Thomas Stempel Pereira

When: March 26, 15:00

Where: MR-408 TPOC-3 (blue building)

SEMINAR ABSTRACT:

XPS (or ESCA) is today a well-accepted standard method for non-destructive chemical analysis, while Angle Resolve Photoemission (ARPES) is widely used to understand electronic properties of novel materials. Modern devices are often only functional in environments far away from ultrahigh vacuum, the standard environment for PES. To contribute to advanced materials analysis means using PES and related techniques in the generic or near generic device environments. This means elevated or near ambient pressures of defined working gas mixtures, liquid media and potentials or magnetic fields applied. Over the last years it has been possible to develop new XPS system designs, that allow work far beyond the standard conditions of high or ultrahigh vacuum. Near Ambient Pressure (NAP) XPS has become a rapidly growing field in research, inspiring many scientists to transfer the method to completely new fields of application. SPECS is the leading manufacturer of turn-key NAP-XPS solutions for synchrotrons and laboratories, including the world’s first fully automated NAP-XPS system EnviroESCA.

Novel materials like graphene or topological insulators show intriguing structural and electronic properties. Samples of interest are often inhomogeneous or instable and meaningful data can only be recorded with high productivity µ-ARPES approaches. The new energy dispersive and filtered momentum microscope KREIOS uses an optimized lens design which provides simultaneously highest energy, angular and lateral resolution. The lens provides a full 2π solid acceptance angle with highest angular resolution

BIO:

Dr. T.Stempel graduated in Berlin at Technical University. He obtained his PhD in Physics on surface analysis on electrochemically modified Silicon. Since 2010 he joined SPECS GmbH in Berlin and currently he is on position of Sales Team Leader.